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Results: 1-10 |
Results: 10
Oxide layers of Zr-1% Nb under PWR primary circuit conditions
Authors: Nagy, G Kerner, Z Battistig, G Pinter-Csordas, A Balogh, J Pajkossy, T
Citation: G. Nagy et al., Oxide layers of Zr-1% Nb under PWR primary circuit conditions, J NUCL MAT, 297(1), 2001, pp. 62-68
Pore propagation directions in p(+) porous silicon
Authors: Vazsonyi, E Battistig, G Horvath, ZE Fried, M Kadar, G Paszti, F Cantin, JL Vanhaeren, D Stalmans, L Poortmans, J
Citation: E. Vazsonyi et al., Pore propagation directions in p(+) porous silicon, J POROUS MA, 7(1-3), 2000, pp. 57-61
Oxygen isotopic tracing study of the dry thermal oxidation of 6H SiC
Authors: Vickridge, IC Ganem, JJ Battistig, G Szilagyi, E
Citation: Ic. Vickridge et al., Oxygen isotopic tracing study of the dry thermal oxidation of 6H SiC, NUCL INST B, 161, 2000, pp. 462-466
Ion beam synthesis of chromium silicide on porous silicon
Authors: Ramos, AR Conde, O Paszti, F Battistig, G Vazsonyi, E da Silva, MR da Silva, MF Soares, JC
Citation: Ar. Ramos et al., Ion beam synthesis of chromium silicide on porous silicon, NUCL INST B, 161, 2000, pp. 926-930
Application of resonant backscattering spectrometry for determination of pore structure changes
Authors: Paszti, F Szilagyi, E Manuaba, A Battistig, G
Citation: F. Paszti et al., Application of resonant backscattering spectrometry for determination of pore structure changes, NUCL INST B, 161, 2000, pp. 963-968
Proton-implantation-induced defects in n-type 6H- and 4H-SiC: An electron paramagnetic resonance study
Authors: von Bardeleben, HJ Cantin, JL Vickridge, I Battistig, G
Citation: Hj. Von Bardeleben et al., Proton-implantation-induced defects in n-type 6H- and 4H-SiC: An electron paramagnetic resonance study, PHYS REV B, 62(15), 2000, pp. 10126-10134
Lattice site determination of Co in low doped congruent LiNbO3 single crystal using PIXE/channelling
Authors: Szilagyi, E Becze-Deak, T Bottyan, L Kocsonya, A Kotai, E Nagy, DL Kling, A Battistig, G Khanh, NQ Polgar, K
Citation: E. Szilagyi et al., Lattice site determination of Co in low doped congruent LiNbO3 single crystal using PIXE/channelling, SOL ST COMM, 115(10), 2000, pp. 535-538
Ion beam characterisation and modification of porous silicon
Authors: Paszti, F Battistig, G
Citation: F. Paszti et G. Battistig, Ion beam characterisation and modification of porous silicon, PHYS ST S-A, 182(1), 2000, pp. 271-278
Enhancement of oxidation resistance in Cu and Cu(Al) thin layers
Authors: Horvath, ZE Peto, G Paszti, Z Zsoldos, E Szilagyi, E Battistig, G Lohner, T Molnar, GL Gyulai, J
Citation: Ze. Horvath et al., Enhancement of oxidation resistance in Cu and Cu(Al) thin layers, NUCL INST B, 148(1-4), 1999, pp. 868-871
Spinodal decomposition in a subsurface layer of a polymer blend film
Authors: Heier, J Kramer, EJ Revesz, P Battistig, G Bates, FS
Citation: J. Heier et al., Spinodal decomposition in a subsurface layer of a polymer blend film, MACROMOLEC, 32(11), 1999, pp. 3758-3765
Risultati: 1-10 |