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Results: 1-21 |
Results: 21
Oxidation of NiFe(20 wt.%) thin films
Authors: Bruckner, W Baunack, S Hecker, M Thomas, J Groudeva-Zotova, S Schneider, CM
Citation: W. Bruckner et al., Oxidation of NiFe(20 wt.%) thin films, MAT SCI E B, 86(3), 2001, pp. 272-275
AES depth profiling multilayers of 3d transition metals
Authors: Baunack, S Menzel, S Bruckner, W Elefant, D
Citation: S. Baunack et al., AES depth profiling multilayers of 3d transition metals, APPL SURF S, 179(1-4), 2001, pp. 25-29
Auger spectroscopy study of MgLi melt affected carbon/pyrocarbon fibres
Authors: Kudela, S John, A Baunack, S Kudela, S Wetzig, K
Citation: S. Kudela et al., Auger spectroscopy study of MgLi melt affected carbon/pyrocarbon fibres, APPL SURF S, 179(1-4), 2001, pp. 129-132
AES analysis of failures in Cu based electromigration test samples
Authors: Baunack, S Kotter, TG Wendrock, H Wetzig, K
Citation: S. Baunack et al., AES analysis of failures in Cu based electromigration test samples, APPL SURF S, 179(1-4), 2001, pp. 245-250
Measurements and simulations of Cherenkov light in lead fluoride crystals
Authors: Achenbach, P Baunack, S Grimm, K Hammel, T von Harrach, D Ginja, AL Maas, FE Schilling, E Stroher, H
Citation: P. Achenbach et al., Measurements and simulations of Cherenkov light in lead fluoride crystals, NUCL INST A, 465(2-3), 2001, pp. 318-328
Abnormal grain growth of sputtered CuNi(Mn) thin films
Authors: Bruckner, W Weihnacht, V Pitschke, W Thomas, J Baunack, S
Citation: W. Bruckner et al., Abnormal grain growth of sputtered CuNi(Mn) thin films, J MATER RES, 15(5), 2000, pp. 1062-1068
Investigations on nanoscale multilayers by analytical TEM in scanning mode
Authors: Thomas, J Bauer, HD Baunack, S Wetzig, K
Citation: J. Thomas et al., Investigations on nanoscale multilayers by analytical TEM in scanning mode, CRYST RES T, 35(6-7), 2000, pp. 839-849
Oxidation, diffusion and segregation in CuNi(Mn) films studied by AES
Authors: Baunack, S Bruckner, W
Citation: S. Baunack et W. Bruckner, Oxidation, diffusion and segregation in CuNi(Mn) films studied by AES, MIKROCH ACT, 133(1-4), 2000, pp. 17-22
XPS and SIMS examination of alumina fibres affected with Mg and MgLi melt
Authors: Kudela, S Oswald, S Kudela, S Baunack, S Wetzig, K
Citation: S. Kudela et al., XPS and SIMS examination of alumina fibres affected with Mg and MgLi melt, MIKROCH ACT, 133(1-4), 2000, pp. 29-34
Oxidation behaviour of PACVD-(Ti,Al)N wear resistance layers
Authors: Menzel, S Gobel, T Baunack, S Bartsch, K Wetzig, K
Citation: S. Menzel et al., Oxidation behaviour of PACVD-(Ti,Al)N wear resistance layers, MIKROCH ACT, 133(1-4), 2000, pp. 215-221
Data preprocessing in peak shape analysis of Auger electron spectra
Authors: Baunack, S
Citation: S. Baunack, Data preprocessing in peak shape analysis of Auger electron spectra, MIKROCH ACT, 133(1-4), 2000, pp. 307-312
Distribution of ion-implanted nitrogen in iron alloys investigated by AES
Authors: Baunack, S Schreiber, G Oettel, H Blawert, C Mordike, BL
Citation: S. Baunack et al., Distribution of ion-implanted nitrogen in iron alloys investigated by AES, MIKROCH ACT, 132(2-4), 2000, pp. 237-242
Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices (vol 77, pg 358, 2000)
Authors: Bruckner, W Baunack, S Hecker, M Monch, JI van Loyen, L Schneider, CM
Citation: W. Bruckner et al., Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices (vol 77, pg 358, 2000), APPL PHYS L, 77(7), 2000, pp. 1064-1064
Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices
Authors: Bruckner, W Baunack, S Hecker, M Monch, JI van Loyen, L Schneider, CM
Citation: W. Bruckner et al., Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices, APPL PHYS L, 77(3), 2000, pp. 358-360
Factor analysis and XPS-data preprocessing for non-conducting samples
Authors: Oswald, S Baunack, S
Citation: S. Oswald et S. Baunack, Factor analysis and XPS-data preprocessing for non-conducting samples, FRESEN J AN, 365(1-3), 1999, pp. 59-62
Surface characterisation of laser irradiated SiC ceramics by AES and XPS
Authors: Baunack, S Oswald, S Tonshoff, HK von Alvensleben, F Temme, T
Citation: S. Baunack et al., Surface characterisation of laser irradiated SiC ceramics by AES and XPS, FRESEN J AN, 365(1-3), 1999, pp. 173-177
Mechanical stress, grain-boundary relaxation, and oxidation of sputtered CuNi(Mn) films
Authors: Bruckner, W Pitschke, W Baunack, S Thomas, J
Citation: W. Bruckner et al., Mechanical stress, grain-boundary relaxation, and oxidation of sputtered CuNi(Mn) films, J MATER RES, 14(4), 1999, pp. 1286-1294
Auger electron spectroscopy study of interdiffusion, oxidation and segregation during thermal treatment of NiCr/CuNi(Mn)/NiCr thin films
Authors: Baunack, S Bruckner, W Pitschke, W Thomas, J
Citation: S. Baunack et al., Auger electron spectroscopy study of interdiffusion, oxidation and segregation during thermal treatment of NiCr/CuNi(Mn)/NiCr thin films, APPL SURF S, 145, 1999, pp. 216-221
Stress and oxidation in CuNi thin films
Authors: Bruckner, W Baunack, S
Citation: W. Bruckner et S. Baunack, Stress and oxidation in CuNi thin films, THIN SOL FI, 356, 1999, pp. 316-321
Hillock growth phenomena during post-indentation annealing of quasicrystalline AlPdMn
Authors: Wolf, B Baunack, S Paufler, P
Citation: B. Wolf et al., Hillock growth phenomena during post-indentation annealing of quasicrystalline AlPdMn, PHYS ST S-A, 172(2), 1999, pp. 317-327
Electrical resistance and mechanical stress in NiCr/Cu/NiCr thin films
Authors: Bruckner, W Baunack, S
Citation: W. Bruckner et S. Baunack, Electrical resistance and mechanical stress in NiCr/Cu/NiCr thin films, J APPL PHYS, 85(2), 1999, pp. 935-940
Risultati: 1-21 |