Authors:
Bazzali, A
Borionetti, G
Falster, R
Gambaro, D
Mule'Stagno, L
Olmo, M
Orizio, R
Porrini, M
Citation: A. Bazzali et al., Non-destructive diagnostic techniques for oxygen precipitates in Czochralski silicon, MAT SC S PR, 4(1-3), 2001, pp. 23-26
