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Results: 1-7 |
Results: 7
Ultraviolet assisted injection liquid source chemical vapour deposition (UVILS-CVD) of tantalum pentoxide
Authors: Kelly, PV Mooney, MB Beechinor, JT O'Sullivan, BJ Hurley, PK Crean, GM Zhang, JY Boyd, IW Paillous, M Jimenez, C Senateur, JP
Citation: Pv. Kelly et al., Ultraviolet assisted injection liquid source chemical vapour deposition (UVILS-CVD) of tantalum pentoxide, ADV MAT OPT, 10(3-5), 2000, pp. 115-122
Thin tantalum pentoxide films deposited by photo-induced chemical vapor deposition using an injection liquid source
Authors: Zhang, JY Boyd, IW Mooney, MB Hurley, PK Beechinor, JT O'Sullivan, BJ Kelly, PV Crean, GM Senateur, JP Jimenez, C Paillous, M
Citation: Jy. Zhang et al., Thin tantalum pentoxide films deposited by photo-induced chemical vapor deposition using an injection liquid source, APPL PHYS A, 70(6), 2000, pp. 647-649
InGaP/GaAs heterojunction bipolar transistor optical and electronic band structure characterization
Authors: Murtagh, M Beechinor, JT Cordero, N Kelly, PV Crean, GM Farrell, IL O'Connor, GM Bland, SW
Citation: M. Murtagh et al., InGaP/GaAs heterojunction bipolar transistor optical and electronic band structure characterization, THIN SOL FI, 364(1-2), 2000, pp. 58-63
Investigation of Si/SiGe heterostructure material using non-destructive optical techniques
Authors: Coonan, BP Griffin, N Beechinor, JT Murtagh, M Redmond, G Crean, GM Hollander, B Mantl, S Bozzo, S Lazzari, JL d'Avitaya, FA Derrien, J Paul, DJ
Citation: Bp. Coonan et al., Investigation of Si/SiGe heterostructure material using non-destructive optical techniques, THIN SOL FI, 364(1-2), 2000, pp. 75-79
Optical and structural properties of InGaP heterostructures
Authors: Moriarty, GR Kildemo, M Beechinor, JT Murtagh, M Kelly, PV Crean, GM Bland, SW
Citation: Gr. Moriarty et al., Optical and structural properties of InGaP heterostructures, THIN SOL FI, 364(1-2), 2000, pp. 244-248
InGaP/GaAs based heterojunction bipolar transistor characterisation using non-contact optical spectroscopy
Authors: Murtagh, M Beechinor, JT Cordero, N Kelly, PV Crean, GM Bland, SW
Citation: M. Murtagh et al., InGaP/GaAs based heterojunction bipolar transistor characterisation using non-contact optical spectroscopy, MAT SCI E B, 66(1-3), 1999, pp. 185-188
Characteristics of tantalum pentoxide dielectric films deposited on silicon by excimer-lamp assisted photo-induced CVD using an injection liquid source.
Authors: Mooney, MB Hurley, PK O'Sullivan, BJ Beechinor, JT Zhang, JY Boyd, IW Kelly, PV Senateur, JP Crean, GM Jimenez, C Paillous, M
Citation: Mb. Mooney et al., Characteristics of tantalum pentoxide dielectric films deposited on silicon by excimer-lamp assisted photo-induced CVD using an injection liquid source., MICROEL ENG, 48(1-4), 1999, pp. 283-286
Risultati: 1-7 |