Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-3
|
Results: 3
Direct bonding of silicon wafers with the concurrent formation of diffusion layers
Authors:
Grekhov, IV Kostina, LS Argunova, TS Belyakova, EI Shmidt, NM Kostin, KB Kim, ED Kim, SC
Citation:
Iv. Grekhov et al., Direct bonding of silicon wafers with the concurrent formation of diffusion layers, TECH PHYS, 46(6), 2001, pp. 690-695
Analysis of charges and surface states at the interfaces of semiconductor-insulator-semiconductor structures
Authors:
Berman, LS Belyakova, EI Kostina, LS Kim, ED Kim, SC
Citation:
Ls. Berman et al., Analysis of charges and surface states at the interfaces of semiconductor-insulator-semiconductor structures, SEMICONDUCT, 34(7), 2000, pp. 786-789
Regular relief on a silicon surface as a structural defect getter
Authors:
Berman, LS Grekhov, IV Kostina, LS Belyakova, EI Kim, ED Kim, SC
Citation:
Ls. Berman et al., Regular relief on a silicon surface as a structural defect getter, TECH PHYS L, 25(1), 1999, pp. 32-34
Risultati:
1-3
|