Authors: O'Hara, MJ Berggren, KK

Citation: Mj. O'Hara et Kk. Berggren, Room-temperature testing for high critical-current-density Josephson junctions, IEEE APPL S, 10(4), 2000, pp. 1669-1672

Authors: Berggren, KK O'Hara, M Sage, JP Worsham, AH

Citation: Kk. Berggren et al., Evaluation of critical current density of Nb/Al/AlOx/Nb Josephson junctions using test structures at 300 K, IEEE APPL S, 9(2), 1999, pp. 3236-3239

Authors: Berggren, KK Macedo, EM Feld, DA Sage, JP

Citation: Kk. Berggren et al., Low T-c superconductive circuits fabricated on 150-mm-diameter wafers using a doubly planarized Nb/AlOx/Nb process, IEEE APPL S, 9(2), 1999, pp. 3271-3274

Authors: Feld, DA Sage, JP Berggren, KK Siddiqui, A

Citation: Da. Feld et al., Measurement of the energy sensitivity of a superconductive comparator, IEEE APPL S, 9(2), 1999, pp. 4361-4366