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Results:
1-8
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Results: 8
Authors:
Zhang, W
Lee, JH
Bernstein, JB
Citation: W. Zhang et al., Energy effect of the laser-induced vertical metallic link, IEEE SEMIC, 14(2), 2001, pp. 163-169
Authors:
Wang, B
Suehle, JS
Vogel, EM
Bernstein, JB
Citation: B. Wang et al., Time-dependent breakdown of ultra-thin SiO2 gate dielectrics under pulsed biased stress, IEEE ELEC D, 22(5), 2001, pp. 224-226
Authors:
Lee, JH
Zhang, W
Bernstein, JB
Citation: Jh. Lee et al., Scalability study of laser-induced vertical make-link structure, IEEE SEMIC, 13(4), 2000, pp. 442-447
Authors:
Bernstein, JB
Lee, JH
Yang, G
Dahmas, TA
Citation: Jb. Bernstein et al., Analysis of laser metal-cut energy process window, IEEE SEMIC, 13(2), 2000, pp. 228-234
Authors:
Shen, CC
Hefner, AR
Berning, DW
Bernstein, JB
Citation: Cc. Shen et al., Failure dynamics of the IGBT during turn-off for unclamped inductive loading conditions, IEEE IND AP, 36(2), 2000, pp. 614-624
Authors:
Vogel, EM
Suehle, JS
Edelstein, MD
Wang, B
Chen, Y
Bernstein, JB
Citation: Em. Vogel et al., Reliability of ultrathin silicon dioxide under combined substrate hot-electron and constant voltage tunneling stress, IEEE DEVICE, 47(6), 2000, pp. 1183-1191
Authors:
Zhang, W
Lee, JH
Chen, Y
Bernstein, JB
Suehle, JS
Citation: W. Zhang et al., Reliability of laser-induced metallic vertical links, IEEE T AD P, 22(4), 1999, pp. 614-619
Authors:
Bernstein, JB
Cowart, W
McDaniel, D
Citation: Jb. Bernstein et al., Bare singular effects in genitive constructions, LINGUIST IN, 30(3), 1999, pp. 493-502
Risultati:
1-8
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