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Authors:
Bertran, E
Martinez, E
Viera, G
Farjas, J
Roura, P
Citation: E. Bertran et al., Mechanical properties of nanometric structures of Si/SiC, C/SiC and C/SiN produced by PECVD, DIAM RELAT, 10(3-7), 2001, pp. 1115-1120
Citation: G. Viera et al., Polymorphous Si thin films from radio frequency plasmas of SiH4 diluted inAr: A study by transmission electron microscopy and Raman spectroscopy, J APPL PHYS, 90(8), 2001, pp. 4272-4280
Authors:
Ferrio, JP
Bertran, E
Nachit, M
Royo, C
Araus, JL
Citation: Jp. Ferrio et al., Near infrared reflectance spectroscopy as a potential surrogate method forthe analysis of Delta C-13 in mature kernels of durum wheat, AUST J AGR, 52(8), 2001, pp. 809-816
Authors:
Bertran, E
Iturriaga, H
Maspoch, S
Montoliu, I
Citation: E. Bertran et al., Effect of orthogonal signal correction on the determination of compounds with very similar near infrared spectra, ANALYT CHIM, 431(2), 2001, pp. 303-311
Authors:
Bertran, E
Blanco, M
Coello, J
Iturriaga, H
Maspoch, S
Montoliu, I
Citation: E. Bertran et al., Near infrared spectrometry and pattern recognition as screening methods for the authentication of virgin olive oils of very close geographical origins, J NEAR IN S, 8(1), 2000, pp. 45-52
Authors:
Bertran, E
Viera, G
Martinez, E
Esteve, J
Maniette, Y
Farjas, J
Roura, P
Citation: E. Bertran et al., Surface analysis of nanostructured ceramic coatings containing silicon carbide nanoparticles produced by plasma modulation chemical vapour deposition, THIN SOL FI, 377, 2000, pp. 495-500
Citation: G. Viera et al., High nucleation rate in pure SiC nanometric powder by a combination of room temperature plasmas and post-thermal treatments, DIAM RELAT, 8(2-5), 1999, pp. 364-368
Authors:
Viera, G
Garcia-Caurel, E
Costa, J
Andujar, JL
Bertran, E
Citation: G. Viera et al., Nanoparticles of Si-C-N from low temperature RF plasmas: selective size, composition and structure, APPL SURF S, 145, 1999, pp. 702-707
Authors:
Viera, G
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Compte, FJ
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Andujar, JL
Bertran, E
Citation: G. Viera et al., Accurate electrical measurements for in situ diagnosis of RF discharges inplasma CVD processes, VACUUM, 53(1-2), 1999, pp. 1-5
Authors:
Viera, G
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Costa, J
Bertran, E
Citation: G. Viera et al., Nanometric powder of stoichiometric silicon carbide produced in square-wave modulated RF glow discharges, VACUUM, 52(1-2), 1999, pp. 183-186
Citation: E. Garcia-caurel et al., Optimized calibration method for Fourier transform infrared phase-modulated ellipsometry, THIN SOL FI, 354(1-2), 1999, pp. 187-194
Authors:
Porqueras, I
Viera, G
Marti, J
Bertran, E
Citation: I. Porqueras et al., Deep profiles of lithium in electrolytic structures of ITO/WO3 for electrochromic applications, THIN SOL FI, 344, 1999, pp. 179-182
Citation: I. Porqueras et al., Optical and electrical characterisation of Ta2O5 thin films for ionic conduction applications, THIN SOL FI, 344, 1999, pp. 449-452
Authors:
Garcia-Caurel, E
Viera, G
Bertran, E
Canillas, A
Citation: E. Garcia-caurel et al., Study of the optical and structural properties of silicon-carbon nanometric powder using infrared phase modulated ellipsometry and electron microscopy, PHYS ST S-A, 175(1), 1999, pp. 373-381