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Results:
1-3
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Results: 3
Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices
Authors:
Jamieson, DN Bettiol, A Yang, CY
Citation:
Dn. Jamieson et al., Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices, APPL SURF S, 169, 2001, pp. 134-141
Analysis of high-power devices using proton beam induced charge microscopy
Authors:
Zmeck, M Phang, J Bettiol, A Osipowicz, T Watt, F Balk, L Niedernostheide, FJ Schulze, HJ Falck, E
Citation:
M. Zmeck et al., Analysis of high-power devices using proton beam induced charge microscopy, MICROEL REL, 41(9-10), 2001, pp. 1519-1524
Investigation of light emitting diodes using nuclear microprobes
Authors:
Yang, CY Bettiol, A Jamieson, D Hua, X Phang, JCH Chan, DSH Watt, F Osipowicz, T
Citation:
Cy. Yang et al., Investigation of light emitting diodes using nuclear microprobes, NUCL INST B, 158(1-4), 1999, pp. 481-486
Risultati:
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