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Results: 1-2 |
Results: 2
In situ optical monitoring of AlGaN thickness and composition during MOVPEgrowth of AlGaN/GaN microwave HFETs
Authors: Balmer, RS Pickering, C Kier, AM Birbeck, JCH Saker, M Martin, T
Citation: Rs. Balmer et al., In situ optical monitoring of AlGaN thickness and composition during MOVPEgrowth of AlGaN/GaN microwave HFETs, J CRYST GR, 230(3-4), 2001, pp. 361-367
Integration of a superlattice limiter into the HBT emitter for improved operational reliability
Authors: Hayes, DG Higgs, AW Smith, GW Birbeck, JCH Wilding, PJ
Citation: Dg. Hayes et al., Integration of a superlattice limiter into the HBT emitter for improved operational reliability, IEEE ELEC D, 21(5), 2000, pp. 203-205
Risultati: 1-2 |