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Results:
1-8
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Results: 8
Authors:
Birkholz, M
Conrad, E
Fuhs, W
Citation: M. Birkholz et al., Crystallinity of thin silicon films deposited at low temperatures: Combined effect of biasing and structuring the substrate, JPN J A P 1, 40(6A), 2001, pp. 4176-4180
Authors:
Birkholz, M
Selle, B
Fuhs, W
Christiansen, S
Strunk, HP
Reich, R
Citation: M. Birkholz et al., Amorphous-crystalline phase transition during the growth of thin films: The case of microcrystalline silicon - art. no. 085402, PHYS REV B, 6408(8), 2001, pp. 5402
Authors:
Jepsen, PU
Schairer, W
Libon, IH
Lemmer, U
Hecker, NE
Birkholz, M
Lips, K
Schall, M
Citation: Pu. Jepsen et al., Ultrafast carrier trapping in microcrystalline silicon observed in opticalpump-terahertz probe measurements, APPL PHYS L, 79(9), 2001, pp. 1291-1293
Authors:
Birkholz, M
Kanschat, P
Weiss, T
Lips, K
Citation: M. Birkholz et al., Electron-paramagnetic resonance (EPR) and light-induced EPR investigationsof CuGaSe2, THIN SOL FI, 361, 2000, pp. 243-247
Authors:
Birkholz, M
Selle, B
Conrad, E
Lips, K
Fuhs, W
Citation: M. Birkholz et al., Evolution of structure in thin microcrystalline silicon films grown by electron-cyclotron resonance chemical vapor deposition, J APPL PHYS, 88(7), 2000, pp. 4376-4379
Authors:
Birkholz, M
Kanschat, P
Weiss, T
Czerwensky, M
Lips, K
Citation: M. Birkholz et al., Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe2, PHYS REV B, 59(19), 1999, pp. 12268-12271
Authors:
Weiss, T
Birkholz, M
Saad, M
Bleyhl, S
Kunst, M
Jager-Waldau, A
Lux-Steiner, MC
Citation: T. Weiss et al., Ag-doped CuGaSe2 as a precursor for thin film solar cells, J CRYST GR, 199, 1999, pp. 1190-1195
Authors:
Birkholz, M
Bohne, W
Rohrich, J
Jager-Waldau, A
Lux-Steiner, MC
Citation: M. Birkholz et al., Stoichiometry and impurity concentrations in II-VI compounds measured by elastic recoil detection analysis (ERDA), J CRYST GR, 197(3), 1999, pp. 571-575
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