Authors:
Krtschil, A
Witte, H
Lisker, M
Christen, J
Krost, A
Birkle, U
Einfeldt, S
Hommel, D
Scholz, F
Off, J
Stutzmann, M
Citation: A. Krtschil et al., Photoelectric properties of the 0.44 eV deep level-to-band transition in gallium nitride investigated by optical admittance spectroscopy, APPL PHYS L, 77(4), 2000, pp. 546-548
Authors:
Krtschil, A
Lisker, M
Witte, H
Christen, J
Birkle, U
Einfeldt, S
Hommel, D
Citation: A. Krtschil et al., Characterization of optical induced defect-band-transitions in MBE grown galliumnitride by optical admittance spectroscopy, MAT SCI E B, 59(1-3), 1999, pp. 226-229
Authors:
Strauf, S
Michler, P
Gutowski, J
Birkle, U
Fehrer, M
Einfeldt, S
Hommel, D
Citation: S. Strauf et al., Optical spectroscopy of Mg- and C-related donor and acceptor levels in GaNgrown by MBE, PHYS ST S-B, 216(1), 1999, pp. 557-560
Authors:
Krtschil, A
Witte, H
Lisker, M
Christen, J
Krost, A
Birkle, U
Einfeldt, S
Hommel, D
Wenzel, A
Rauschenbach, B
Citation: A. Krtschil et al., Incorporation of deep defects in GaN induced by doping and implantation processes, PHYS ST S-B, 216(1), 1999, pp. 587-591
Authors:
Krtschil, A
Witte, H
Lisker, M
Christen, J
Birkle, U
Einfeldt, S
Hommel, D
Citation: A. Krtschil et al., Characterization of electronic states in molecular beam epitaxy grown GaN by optical admittance spectroscopy: Comparison of different nitrogen plasmasources, APPL PHYS L, 74(14), 1999, pp. 2032-2034