Authors: Umbach, CC Blakely, JM

Citation: Cc. Umbach et Jm. Blakely, Development of a sub-picoampere scanning tunneling microscope for oxide surfaces, APPL SURF S, 175, 2001, pp. 746-752

Authors: Lee, D Blakely, JM Schroeder, TW Engstrom, JR

Citation: D. Lee et al., A growth method for creating arrays of atomically flat mesas on silicon, APPL PHYS L, 78(10), 2001, pp. 1349-1351

Authors: Oliver, AC Blakely, JM

Citation: Ac. Oliver et Jm. Blakely, Thin SiO2 layers on Si(111) with ultralow atomic step density, J VAC SCI B, 18(6), 2000, pp. 2862-2864

Authors: Blakely, JM Umbach, CC

Citation: Jm. Blakely et Cc. Umbach, Topography and lattice strain development on patterned Si surfaces, MICRON, 30(1), 1999, pp. 3-12

Authors: Tanaka, S Umbach, CC Shen, Q Blakely, JM

Citation: S. Tanaka et al., Lattice strain in oxidized Si nanostructure arrays from X-ray measurements, THIN SOL FI, 344, 1999, pp. 365-369

Authors: Blakely, JM Tanaka, S Tromp, RM

Citation: Jm. Blakely et al., Atomic step dynamics on periodic semiconductor surface structures, J ELEC MICR, 48(6), 1999, pp. 747-752