Authors: Deb, N Blanton, RD

Citation: N. Deb et Rd. Blanton, High-level fault modeling in surface-micromachined MEMS, ANALOG IN C, 29(1-2), 2001, pp. 151-158

Authors: Blanton, RD Hayes, JP

Citation: Rd. Blanton et Jp. Hayes, On the design of fast, easily testable ALU's, IEEE VLSI, 8(2), 2000, pp. 220-223

Authors: Kolpekwar, A Jiang, T Blanton, RD

Citation: A. Kolpekwar et al., CARAMEL: Contamination and reliability analysis of MicroElectromechanical layout, J MICROEL S, 8(3), 1999, pp. 309-318

Authors: Courtois, B Blanton, RD

Citation: B. Courtois et Rd. Blanton, MEMS - Introduction, IEEE DES T, 16(4), 1999, pp. 16-17