Citation: Rmj. Bokel et al., Effect of electron beam parameters on simulated CBED patterns from edge-ongrain boundaries, J MICROSC O, 197, 2000, pp. 52-59
Authors:
Bokel, RMJ
Jansen, J
van Dyck, D
Zandbergen, HW
Citation: Rmj. Bokel et al., The effect of mechanical vibration and drift on the reconstruction of exitwaves from a through focus series of HREM images, ULTRAMICROS, 80(4), 1999, pp. 255-269