Authors:
Boon, G
Langenaeker, W
De Proft, F
De Winter, H
Tollenaere, JP
Geerlings, P
Citation: G. Boon et al., Systematic study of the quality of various quantum similarity descriptors.Use of the autocorrelation function and principal component analysis, J PHYS CH A, 105(38), 2001, pp. 8805-8814
Citation: G. Boon et Gf. Bastin, The use of a phi(rho z) model for simultaneous determination of composition and thickness in analytical transmission electron microscopy, ULTRAMICROS, 85(1), 2000, pp. 1-7