Authors: Beaudoin, M Johnson, SR Boonzaayer, MD Zhang, YH Johs, B

Citation: M. Beaudoin et al., Use of spectroscopic ellipsometry for feedback control during the growth of thin AlAs layers, J VAC SCI B, 17(3), 1999, pp. 1233-1236

Authors: Johnson, SR Grassi, E Beaudoin, M Boonzaayer, MD Tsakalis, KS Zhang, YH

Citation: Sr. Johnson et al., Closed-loop control of composition and temperature during the growth of InGaAs lattice matched to InP, J VAC SCI B, 17(3), 1999, pp. 1237-1240

Authors: Johnson, SR Grassi, E Beaudoin, M Boonzaayer, MD Tsakalis, KS Zhang, YH

Citation: Sr. Johnson et al., Feedback control of substrate temperature during the growth of near-lattice-matched InGaAs on InP using diffuse reflection spectroscopy, J CRYST GR, 202, 1999, pp. 40-44

Authors: Beaudoin, M Kelkar, P Boonzaayer, MD Braun, W Dowd, P Johnson, SR Koelle, U Ryu, CM Zhang, YH

Citation: M. Beaudoin et al., Growth of resonant-cavity enhanced photodetectors by MBE with in situ feedback control using spectroscopic ellipsometry, J CRYST GR, 202, 1999, pp. 990-993