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Citation: H. Bluteau et P. Bourdet, Quality follow-up of CMM via the measurement of microdefects, MEASUREMENT, 29(4), 2001, pp. 307-315

Authors: Legoff, O Villeneuve, F Bourdet, P

Citation: O. Legoff et al., Geometrical tolerancing in process planning: a tridimensional approach, P I MEC E B, 213(6), 1999, pp. 635-640