Authors: Spruytte, S Coldren, C Harris, J Pantelidis, D Lee, HJ Bravman, J Kelly, M

Citation: S. Spruytte et al., Use of angle resolved x-ray photoelectron spectroscopy for determination of depth and thickness of compound layer structures, J VAC SCI A, 19(2), 2001, pp. 603-608

Authors: Shukla, A Timblin, CR Hubbard, AK Bravman, J Mossman, BT

Citation: A. Shukla et al., Silica-induced activation of c-Jun-NH2-terminal amino kinases, protracted expression of the activator protein-1 proto-oncogene, fra-1, and S-phase alterations are mediated via oxidative stress, CANCER RES, 61(5), 2001, pp. 1791-1795