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Citation: J. Briaire et Ks. Krisch, Principles of substrate crosstalk generation in CMOS circuits, IEEE COMP A, 19(6), 2000, pp. 645-653

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Citation: J. Briaire et Lkj. Vandamme, The influence of a digital spectrum analyzer on the uncertainty in 1/f noise parameters, MICROEL REL, 40(11), 2000, pp. 1975-1980

Authors: Jonker, RJW Briaire, J Vandamme, LKJ

Citation: Rjw. Jonker et al., Automated system for noise-measurements on low-ohmic samples and magnetic sensors, IEEE INSTR, 48(3), 1999, pp. 730-735