Authors:
Schaefer, HE
Reimann, K
Straub, W
Phillipp, F
Tanimoto, H
Brossmann, U
Wurschum, R
Citation: He. Schaefer et al., Interface structure studies by atomic resolution electron microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids, MAT SCI E A, 286(1), 2000, pp. 24-33