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Measurement of low-frequency base and collector current noise and coherence in SiGe heterojunction bipolar transistors using transimpedance amplifiers
Authors:
Bruce, SPO Vandamme, LKJ Rydberg, A
Citation:
Spo. Bruce et al., Measurement of low-frequency base and collector current noise and coherence in SiGe heterojunction bipolar transistors using transimpedance amplifiers, IEEE DEVICE, 46(5), 1999, pp. 993-1000
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