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Citation: Rw. Bush et al., Pitfalls to avoid in threshold testing and its interpretation, AM SOC TEST, 1372, 2000, pp. 269-284

Authors: Bucci, RJ Warren, CJ Starke, EA

Citation: Rj. Bucci et al., Need for new materials in aging aircraft structures, J AIRCRAFT, 37(1), 2000, pp. 122-129