Citation: A. Pawlowski et al., Diffusion induced grain boundary migration (DIGM) process in ZrO2Y2O3-MgO ion conductors, ARCH METALL, 45(1), 2000, pp. 89-101
Citation: A. Pawlowski et al., Microstructure and properties of ion conductors in the ZrO2-Y2O3-MgO system as an effect of DIGM process, ARCH METALL, 44(4), 1999, pp. 375-384