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Results:
1-13
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Results: 13
Authors:
Suvorova, EI
Buffat, PA
Citation: Ei. Suvorova et Pa. Buffat, Size effect in X-ray and electron diffraction patterns from hydroxyapatiteparticles, CRYSTALLO R, 46(5), 2001, pp. 722-729
Authors:
Sfeir, J
Buffat, PA
Mockli, P
Xanthopoulos, N
Vasquez, R
Mathieu, HJ
Van herle, J
Thampi, KR
Citation: J. Sfeir et al., Lanthanum chromite based catalysts for oxidation of methane directly on SOFC anodes, J CATALYSIS, 202(2), 2001, pp. 229-244
Authors:
Cayron, C
Buffat, PA
Citation: C. Cayron et Pa. Buffat, Transmission electron microscopy study of the beta ' phase (Al-Mg-Si alloys) and QC phase (Al-Cu-Mg-Si alloys): Ordering mechanism and crystallographic structure, ACT MATER, 48(10), 2000, pp. 2639-2653
Authors:
Leifer, K
Buffat, PA
Stadelmann, PA
Kapon, E
Citation: K. Leifer et al., Theoretical and experimental limits of the analysis of III/V semiconductors using EELS, MICRON, 31(4), 2000, pp. 411-427
Authors:
Cayron, C
Sagalowicz, L
Beffort, O
Buffat, PA
Citation: C. Cayron et al., Structural phase transition in Al-Cu-Mg-Si alloys by transmission electronmicroscopy study on an Al-4 wt% Cu-1 wt% Mg-Ag alloy reinforced by SiC particles, PHIL MAG A, 79(11), 1999, pp. 2833-2851
Authors:
Audinet, L
Ricolleau, C
Gandais, M
Gacoin, T
Boilot, JP
Buffat, PA
Citation: L. Audinet et al., Structural properties of coated nanoparticles: the CdS/ZnS nanostructure, PHIL MAG A, 79(10), 1999, pp. 2379-2396
Authors:
Buffat, PA
Citation: Pa. Buffat, Electron microscopy for the characterisation of atmospheric particles, ANALUSIS, 27(4), 1999, pp. 340-346
Authors:
Foeth, M
Stadelmann, P
Buffat, PA
Citation: M. Foeth et al., Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy, ULTRAMICROS, 75(4), 1999, pp. 203-213
Authors:
Cayron, C
Buffat, PA
Hausmann, C
Beffort, O
Citation: C. Cayron et al., About the epitaxial growth of Mg-subgrains on Al2MgC2 interfacial carbidesin a squeeze cast Mg-4Al/T300 metal matrix composite, J MAT SCI L, 18(20), 1999, pp. 1671-1674
Authors:
Cleton, F
Jouneau, PH
Henry, S
Gaumann, M
Buffat, PA
Citation: F. Cleton et al., Crystallographic orientation assessment by electron backscattered diffraction, SCANNING, 21(4), 1999, pp. 232-237
Authors:
Suvorova, EI
Buffat, PA
Citation: Ei. Suvorova et Pa. Buffat, Electron diffraction from micro- and nanoparticles of hydroxyapatite, J MICROSC O, 196, 1999, pp. 46-58
Authors:
Cayron, C
Buffat, PA
Beffort, O
Long, S
Citation: C. Cayron et al., Effect of SiO2 binder on the precipitation state of an AlCu4Mg1Ag/Saffil composite, J MATER SCI, 34(5), 1999, pp. 905-915
Authors:
Foeth, M
Sfera, A
Stadelmann, P
Buffat, PA
Citation: M. Foeth et al., A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls, J ELEC MICR, 48(6), 1999, pp. 717-723
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1-13
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