Authors:
Fonseca, LF
Resto, O
Soni, RK
Buzaianu, M
Weisz, SZ
Gomez, M
Jia, W
Citation: Lf. Fonseca et al., Comparative analysis of the 1.54 mu m emission of Er-doped Si/SiO2 films and the size distribution of the nanostructure, MAT SCI E B, 72(2-3), 2000, pp. 109-112