AAAAAA

   
Results: 1-2 |
Results: 2
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices
Authors: Litzenberger, M Pichler, R Bychikhin, S Pogany, D Gornik, E Esmark, K Gossner, H
Citation: M. Litzenberger et al., Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices, MICROEL REL, 41(9-10), 2001, pp. 1385-1390
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures
Authors: Bychikhin, S Litzenberger, M Pichler, R Pogany, D Gornik, E Groos, G Stecher, M
Citation: S. Bychikhin et al., Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures, MICROEL REL, 41(9-10), 2001, pp. 1501-1506
Risultati: 1-2 |