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Citation: Sa. Bychikhin et al., Estimation of tunneling-barrier width in scanning tunneling microscope from noise characteristics, MEAS TECH R, 42(12), 2000, pp. 1187-1192

Authors: Bychikhin, SA Gallyamov, MO Potemkin, VV Stepanov, AV Yaminskii, IV

Citation: Sa. Bychikhin et al., Scanning tunneling microscope - A nanoelectronic measuring instrument, MEAS TECH R, 41(4), 1998, pp. 383-388