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Results: 1-25 | 26-50 | 51-75 | 76-77 |
Results: 76-77/77
CHARGE TRAPPING AND DEVICE DEGRADATION INDUCED BY X-RAY-IRRADIATION IN METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS
Authors: CAMPBELL SA LEE KH LI HH NACHMAN R CERRINA F
Citation: Sa. Campbell et al., CHARGE TRAPPING AND DEVICE DEGRADATION INDUCED BY X-RAY-IRRADIATION IN METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS, Applied physics letters, 63(12), 1993, pp. 1646-1647
MICROSCOPIC-SCALE LATERAL INHOMOGENEITIES OF THE PHOTOEMISSION RESPONSE OF CLEAVED GAAS
Authors: CERRINA F RAYCHAUDHURI AK NG W LIANG S SINGH S WELNAK JT WALLACE JP CAPASSO C UNDERWOOD JH KORTRIGHT JB PERERA RCC MARGARITONDO G
Citation: F. Cerrina et al., MICROSCOPIC-SCALE LATERAL INHOMOGENEITIES OF THE PHOTOEMISSION RESPONSE OF CLEAVED GAAS, Applied physics letters, 63(1), 1993, pp. 63-65
Risultati: 1-25 | 26-50 | 51-75 | 76-77 |