Authors: PERSHENKOV VS CHIROKOV MS BRETCHKO PT FASTENKO PO BAEV VK BELYAKOV VV

Citation: Vs. Pershenkov et al., EFFECT OF JUNCTION FRINGING FIELD ON RADIATION-INDUCED LEAKAGE CURRENT IN OXIDE ISOLATION STRUCTURES AND NONUNIFORM DAMAGE NEAR THE CHANNELEDGES IN MOSFETS, IEEE transactions on nuclear science, 41(6), 1994, pp. 1895-1901