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Results: 1-7 |
Results: 7

Authors: CHOURASIA AR HOOD SJ CHOPRA DR
Citation: Ar. Chourasia et al., A STUDY OF SI COMPOUNDS BY ZR L-ALPHA PHOTOELECTRON-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 699-703

Authors: CHOURASIA AR SEABOLT MA JUSTISS RL CHOPRA DR WIESINGER G
Citation: Ar. Chourasia et al., APPEARANCE-POTENTIAL STUDY OF PRMN2 AND SMMN2 INTERMETALLICS, Journal of alloys and compounds, 224(2), 1995, pp. 287-291

Authors: CHOURASIA AR CHOPRA DR
Citation: Ar. Chourasia et Dr. Chopra, X-RAY PHOTOELECTRON STUDY OF TIN SIO2 AND TIN/SI INTERFACES/, Thin solid films, 266(2), 1995, pp. 298-301

Authors: MCGUIRE GE SWANSON ML PARIKH NR SIMKO S WEISS PS FERRIS JH NEMANICH RJ CHOPRA DR CHOURASIA AR
Citation: Ge. Mcguire et al., SURFACE CHARACTERIZATION, Analytical chemistry, 67(12), 1995, pp. 199-220

Authors: CHOURASIA AR CHOPRA DR WIESINGER G
Citation: Ar. Chourasia et al., A STUDY OF THE ELECTRONIC-STRUCTURE OF GDMN2 BY APPEARANCE-POTENTIAL SPECTROSCOPY (SXAPS), Journal of electron spectroscopy and related phenomena, 70(1), 1994, pp. 23-28

Authors: PEREZ JM LIN C RIVERA W HYER RC GREEN M SHARMA SC CHOPRA DR CHOURASIA AR
Citation: Jm. Perez et al., SCANNING TUNNELING MICROSCOPY OF THE ELECTRONIC-STRUCTURE OF CHEMICALVAPOR-DEPOSITED DIAMOND FILMS, Applied physics letters, 62(16), 1993, pp. 1889-1891

Authors: MCGUIRE GE RAY MA SIMKO SJ PERKINS FK BRANDOW SL DOBISZ EA NEMANICH RJ CHOURASIA AR CHOPRA DR
Citation: Ge. Mcguire et al., SURFACE CHARACTERIZATION, Analytical chemistry, 65(12), 1993, pp. 311-333
Risultati: 1-7 |