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Results: 1
A MICROCONTROLLER-BASED SYSTEM FOR PIEZOSCANNER NONLINEARITY CORRECTION - ATOMIC-FORCE MICROSCOPE
Authors:
CIDADE GAG WEISSMULLER G BISCH PM
Citation:
Gag. Cidade et al., A MICROCONTROLLER-BASED SYSTEM FOR PIEZOSCANNER NONLINEARITY CORRECTION - ATOMIC-FORCE MICROSCOPE, Review of scientific instruments, 69(10), 1998, pp. 3593-3597
Risultati:
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