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Results: 1-25/51
Authors:
CRICENTI A
GIRASOLE M
GENEROSI R
COLUZZA C
CAPONE S
SICILIANO P
Citation: A. Cricenti et al., ATOMIC-FORCE MICROSCOPY CHARACTERIZATION OF SPUTTERED VANADIUM-OXIDE THIN-FILMS GROWN ON AL2O3 SUBSTRATE, Applied physics A: Materials science & processing, 66, 1998, pp. 1175-1178
Authors:
ALMEIDA J
MARGARITONDO G
COLUZZA C
DAVY S
SPAJER M
COURJON D
Citation: J. Almeida et al., LATERALLY-RESOLVED STUDY OF THE AU SINX/GAAS(100) INTERFACE/, Applied surface science, 125(1), 1998, pp. 6-10
Authors:
IVANCO J
ALMEIDA J
COLUZZA C
ZWICK F
MARGARITONDO G
Citation: J. Ivanco et al., SCHOTTKY-BARRIER HEIGHT DEPENDENCE ON THE SILICON INTERLAYER THICKNESS OF AU SI/N-GAAS CONTACTS - CHEMISTRY OF INTERFACE FORMATION STUDY/, Vacuum, 50(3-4), 1998, pp. 407-411
Authors:
ALMEIDA J
MARGARITONDO G
RIGHINI M
SELCI S
COLUZZA C
Citation: J. Almeida et al., BALLISTIC-ELECTRON-EMISSION AND SECONDARY PHOTOELECTRON MICROSCOPY OFTHE SULFUR-PASSIVATED PT-GAP(001) INTERFACE, Surface science, 404(1-3), 1998, pp. 470-474
Authors:
IVANEO J
HORVATH ZJ
VANTUYEN V
COLUZZA C
ALMEIDA J
TERRASI A
PECZ B
VINCZE G
MARGARITONDO G
Citation: J. Ivaneo et al., ELECTRICAL CHARACTERIZATION OF AU SIOX/N-GAAS JUNCTIONS/, Solid-state electronics, 42(2), 1998, pp. 229-233
Authors:
CRICENTI A
GENEROSI R
PERFETTI P
GILLIGAN JM
TOLK NH
COLUZZA C
MARGARITONDO G
Citation: A. Cricenti et al., FREE-ELECTRON-LASER NEAR-FIELD NANOSPECTROSCOPY, Applied physics letters, 73(2), 1998, pp. 151-153
Authors:
COLUZZA C
MOBERG R
Citation: C. Coluzza et R. Moberg, SPECTROMICROSCOPY AND CHEMICAL IMAGING BY LATERALLY-RESOLVED ESCA, Journal of electron spectroscopy and related phenomena, 84(1-3), 1997, pp. 109-127
Authors:
COLUZZA C
Citation: C. Coluzza, SPECTROMICROSCOPY AND CHEMICAL IMAGING APPLIED TO THE STUDY OF PHOTOCATHODE MATERIALS AND DEVICES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 387(1-2), 1997, pp. 24-32
Authors:
RUDOLF P
MARCHAL F
SPORKEN R
CAUDANO R
DELLORTO T
ALMEIDA J
BRAEM A
PIUZ F
SGOBBA S
PAIC G
NAPPI E
VALENTINI A
SARTORI P
COLUZZA C
Citation: P. Rudolf et al., LATERALLY RESOLVED MEASUREMENTS OF POLYCRYSTALLINE CESIUM IODIDE SURFACES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 387(1-2), 1997, pp. 163-170
Authors:
ALMEIDA J
COLUZZA C
DELLORTO T
MARGARITONDO G
TERRASI A
IVANCO J
Citation: J. Almeida et al., AU GAAS(100) INTERFACE SCHOTTKY-BARRIER MODIFICATION BY A SILICON-NITRIDE INTRALAYER/, Journal of applied physics, 81(1), 1997, pp. 292-296
Authors:
CRICENTI A
GENEROSI R
SCARSELLI MA
PERFETTI P
SICILIANO P
SERRA A
TEPORE A
ALMEIDA J
COLUZZA C
MARGARITONDO G
Citation: A. Cricenti et al., PT-SNO2 THIN-FILMS FOR GAS SENSOR CHARACTERIZED BY ATOMIC-FORCE MICROSCOPY AND X-RAY PHOTOEMISSION SPECTROMICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1527-1530
Authors:
VANDERPUTTEN D
ZANONI R
COLUZZA C
SCHMID G
Citation: D. Vanderputten et al., ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPIC EXPERIMENTS ON THE FULL SERIES OF MOLECULAR [AU-55(PR(3))(12)CL-6] CLUSTERS, Journal of the Chemical Society. Dalton transactions, (8), 1996, pp. 1721-1725
Authors:
COLUZZA C
Citation: C. Coluzza, ULTRA ACCURATE MEASUREMENTS OF INTERFACE PARAMETERS WITH FREE-ELECTRON LASER, Applied surface science, 92, 1996, pp. 267-272
Authors:
COLUZZA C
ALMEIDA J
DELLORTO T
BARBO F
BERTOLO M
BIANCO A
CERASARI S
FONTANA S
BERGOSSI O
SPAJER M
COURJON D
Citation: C. Coluzza et al., SPATIALLY-RESOLVED INTERNAL AND EXTERNAL PHOTOEMISSION OF PT N-GAP SCHOTTKY-BARRIER/, Applied surface science, 104, 1996, pp. 196-203
Authors:
TERRASI A
ALMEIDA J
COLUZZA C
MARGARITONDO G
Citation: A. Terrasi et al., SILICON-OXIDE THIN-FILMS OBTAINED BY AR-TEMPERATURE( BOMBARDMENT OF SI(100) IN OXYGEN ATMOSPHERE AT ROOM), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 116(1-4), 1996, pp. 416-419
Authors:
CRICENTI A
GENEROSI R
SCARSELLI MA
PERFETTI P
SICILIANO P
SERRA A
TEPORE A
COLUZZA C
ALMEIDA J
MARGARITONDO G
Citation: A. Cricenti et al., MORPHOLOGICAL, CHEMICAL AND ELECTRICAL CHARACTERIZATION OF PT-SNO2 THIN-FILM GROWN ON ROUGH AND MECHANICALLY POLISHED AL2O3 SUBSTRATES, Journal of physics. D, Applied physics, 29(9), 1996, pp. 2235-2239
Authors:
DIVENTRA M
PAPP G
COLUZZA C
BALDERESCHI A
SCHULZ PA
Citation: M. Diventra et al., INDENTED BARRIER RESONANT-TUNNELING RECTIFIERS, Journal of applied physics, 80(7), 1996, pp. 4174-4176
Authors:
ALMEIDA J
COLUZZA C
DELLORTO T
BARBO F
BERTOLO M
BIANCO A
CERASARI S
FONTANA S
MARGARITONDO G
Citation: J. Almeida et al., PHOTOEMISSION ELECTRON-MICROSCOPY STUDIES OF PT GAP(001) BURIED INTERFACES/, Journal of applied physics, 80(3), 1996, pp. 1460-1464
Authors:
BOUVET D
CLIVAZ PA
DUTOIT M
COLUZZA C
ALMEIDA J
MARGARITONDO G
PIO F
Citation: D. Bouvet et al., INFLUENCE OF NITROGEN PROFILE AN ELECTRICAL CHARACTERISTICS OF FURNACE-NITRIDED OR RAPID THERMALLY NITRIDED SILICON DIOXIDE FILMS, Journal of applied physics, 79(9), 1996, pp. 7114-7122
Authors:
ALMEIDA J
ORTO TD
COLUZZA C
MARGARITONDO G
BERGOSSI O
SPAJER M
COURJON D
Citation: J. Almeida et al., NOVEL SPECTROMICROSCOPY - PT-GAP STUDIES BY SPATIALLY-RESOLVED INTERNAL PHOTOEMISSION WITH NEAR-FIELD OPTICS, Applied physics letters, 69(16), 1996, pp. 2361-2363
Authors:
PAPP G
DIVENTRA M
COLUZZA C
BALDERESCHI A
MARGARITONDO G
Citation: G. Papp et al., CURRENT RECTIFICATION THROUGH A SINGLE-BARRIER RESONANT-TUNNELING QUANTUM STRUCTURE, Superlattices and microstructures, 17(3), 1995, pp. 273-275
Authors:
PAPP G
COLUZZA C
DIVENTRA M
BALDERESCHI A
MARGARITONDO G
GU BY
Citation: G. Papp et al., THE I-V CHARACTERISTICS OF DOUBLE-BARRIER STAIR-WELLS, Superlattices and microstructures, 17(1), 1995, pp. 117-121
Authors:
DELLORTO T
ALMEIDA J
COLUZZA C
CONFORTO E
DESTASIO G
MARGARITONDO G
PAIC G
BRAEM A
PIUZ F
TONNER BP
Citation: T. Dellorto et al., LATERALLY RESOLVED MEASUREMENTS OF CESIUM IODIDE QUANTUM YIELD, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2787-2790
Authors:
MARGARITONDO G
DESTASIO G
COLUZZA C
Citation: G. Margaritondo et al., PHOTOEMISSION SPECTROMICROSCOPY IN MATERIALS SCIENCE AND IN NEUROBIOLOGY, Journal of electron spectroscopy and related phenomena, 72, 1995, pp. 281-287
Authors:
ANDERLE M
COLUZZA C
MARGARITONDO G
SANCROTTI M
Citation: M. Anderle et al., UNTITLED - FOREWORD, Surface review and letters, 2(6), 1995, pp. 807-807