Authors:
CONDO JP
GONCALVES M
BROGUEIRA P
SCHOTTEN V
CHU V
Citation: Jp. Condo et al., PHOTOCONDUCTIVE ANALYSIS OF DEFECT DENSITY OF HYDROGENATED AMORPHOUS-SILICON DURING ROOM-TEMPERATURE PLASMA POSTHYDROGENATION, LIGHT SOAKING, AND THERMAL ANNEALING, Physical review. B, Condensed matter, 53(4), 1996, pp. 1886-1890