Authors: CONDO JP GONCALVES M BROGUEIRA P SCHOTTEN V CHU V

Citation: Jp. Condo et al., PHOTOCONDUCTIVE ANALYSIS OF DEFECT DENSITY OF HYDROGENATED AMORPHOUS-SILICON DURING ROOM-TEMPERATURE PLASMA POSTHYDROGENATION, LIGHT SOAKING, AND THERMAL ANNEALING, Physical review. B, Condensed matter, 53(4), 1996, pp. 1886-1890