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Results: 1-12 |
Results: 12
QUARTZ-CRYSTAL MICROBALANCE - A NEW DESIGN ELIMINATES SENSITIVITY OUTSIDE THE ELECTRODES, OFTEN WRONGLY ATTRIBUTED TO THE ELECTRIC FRINGINGFIELD
Authors: CUMPSON PJ
Citation: Pj. Cumpson, QUARTZ-CRYSTAL MICROBALANCE - A NEW DESIGN ELIMINATES SENSITIVITY OUTSIDE THE ELECTRODES, OFTEN WRONGLY ATTRIBUTED TO THE ELECTRIC FRINGINGFIELD, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(4), 1997, pp. 2407-2412
ELASTIC-SCATTERING CORRECTIONS IN AES AND XPS .2. ESTIMATING ATTENUATION LENGTHS AND CONDITIONS REQUIRED FOR THEIR VALID USE IN OVERLAYER SUBSTRATE EXPERIMENTS/
Authors: CUMPSON PJ SEAH MP
Citation: Pj. Cumpson et Mp. Seah, ELASTIC-SCATTERING CORRECTIONS IN AES AND XPS .2. ESTIMATING ATTENUATION LENGTHS AND CONDITIONS REQUIRED FOR THEIR VALID USE IN OVERLAYER SUBSTRATE EXPERIMENTS/, Surface and interface analysis, 25(6), 1997, pp. 430-446
ELASTIC-SCATTERING CORRECTIONS IN AES AND XPS .3. BEHAVIOR OF ELECTRON-TRANSPORT MEAN FREE-PATH IN SOLIDS FOR KINETIC ENERGIES IN THE RANGE100EV-LESS-THAN-E-LESS-THAN-400EV
Authors: CUMPSON PJ
Citation: Pj. Cumpson, ELASTIC-SCATTERING CORRECTIONS IN AES AND XPS .3. BEHAVIOR OF ELECTRON-TRANSPORT MEAN FREE-PATH IN SOLIDS FOR KINETIC ENERGIES IN THE RANGE100EV-LESS-THAN-E-LESS-THAN-400EV, Surface and interface analysis, 25(6), 1997, pp. 447-453
MONTE-CARLO CALCULATIONS OF THE DEPTH DISTRIBUTION FUNCTION IN MULTILAYERED STRUCTURES
Authors: JACKSON AR ELGOMATI MM MATTHEW JAD CUMPSON PJ
Citation: Ar. Jackson et al., MONTE-CARLO CALCULATIONS OF THE DEPTH DISTRIBUTION FUNCTION IN MULTILAYERED STRUCTURES, Surface and interface analysis, 25(5), 1997, pp. 341-351
SIMPLE PROCEDURE FOR PRECISE PEAK MAXIMUM ESTIMATION FOR ENERGY CALIBRATION IN AES AND XPS
Authors: CUMPSON PJ SEAH MP SPENCER SJ
Citation: Pj. Cumpson et al., SIMPLE PROCEDURE FOR PRECISE PEAK MAXIMUM ESTIMATION FOR ENERGY CALIBRATION IN AES AND XPS, Surface and interface analysis, 24(10), 1996, pp. 687-694
STABILITY OF REFERENCE MASSES .4. GROWTH OF CARBONACEOUS CONTAMINATION ON PLATINUM-IRIDIUM ALLOY SURFACES, AND CLEANING BY UV OZONE TREATMENT/
Authors: CUMPSON PJ SEAH MP
Citation: Pj. Cumpson et Mp. Seah, STABILITY OF REFERENCE MASSES .4. GROWTH OF CARBONACEOUS CONTAMINATION ON PLATINUM-IRIDIUM ALLOY SURFACES, AND CLEANING BY UV OZONE TREATMENT/, Metrologia, 33(6), 1996, pp. 507-532
ANGLE-RESOLVED XPS AND AES - DEPTH-RESOLUTION LIMITS AND A GENERAL COMPARISON OF PROPERTIES OF DEPTH-PROFILE RECONSTRUCTION METHODS
Authors: CUMPSON PJ
Citation: Pj. Cumpson, ANGLE-RESOLVED XPS AND AES - DEPTH-RESOLUTION LIMITS AND A GENERAL COMPARISON OF PROPERTIES OF DEPTH-PROFILE RECONSTRUCTION METHODS, Journal of electron spectroscopy and related phenomena, 73(1), 1995, pp. 25-52
STABILITY OF REFERENCE MASSES .3. MECHANISM AND LONG-TERM EFFECTS OF MERCURY CONTAMINATION ON PLATINUM-IRIDIUM MASS STANDARDS
Authors: CUMPSON PJ SEAH MP
Citation: Pj. Cumpson et Mp. Seah, STABILITY OF REFERENCE MASSES .3. MECHANISM AND LONG-TERM EFFECTS OF MERCURY CONTAMINATION ON PLATINUM-IRIDIUM MASS STANDARDS, Metrologia, 31(5), 1995, pp. 375-388
SIMPLE METHOD OF DEPTH PROFILING (STRATIFYING) CONTAMINATION LAYERS, ILLUSTRATED BY STUDIES ON STAINLESS-STEEL
Authors: SEAH MP QIU JH CUMPSON PJ CASTLE JE
Citation: Mp. Seah et al., SIMPLE METHOD OF DEPTH PROFILING (STRATIFYING) CONTAMINATION LAYERS, ILLUSTRATED BY STUDIES ON STAINLESS-STEEL, Surface and interface analysis, 21(6-7), 1994, pp. 336-341
STABILITY OF REFERENCE MASSES-II - THE EFFECT OF ENVIRONMENT AND CLEANING METHODS ON THE SURFACES OF STAINLESS-STEEL AND ALLIED MATERIALS
Authors: SEAH MP QIU JH CUMPSON PJ CASTLE JE
Citation: Mp. Seah et al., STABILITY OF REFERENCE MASSES-II - THE EFFECT OF ENVIRONMENT AND CLEANING METHODS ON THE SURFACES OF STAINLESS-STEEL AND ALLIED MATERIALS, Metrologia, 31(2), 1994, pp. 93-108
STABILITY OF REFERENCE MASSES .1. EVIDENCE FOR POSSIBLE VARIATIONS INTHE MASS OF REFERENCE KILOGRAMS ARISING FROM MERCURY CONTAMINATION
Authors: CUMPSON PJ SEAH MP
Citation: Pj. Cumpson et Mp. Seah, STABILITY OF REFERENCE MASSES .1. EVIDENCE FOR POSSIBLE VARIATIONS INTHE MASS OF REFERENCE KILOGRAMS ARISING FROM MERCURY CONTAMINATION, Metrologia, 31(1), 1994, pp. 21-26
ELASTIC-SCATTERING CORRECTIONS IN AES AND XPS .1. 2 RAPID MONTE-CARLOMETHODS FOR CALCULATING THE DEPTH DISTRIBUTION FUNCTION
Authors: CUMPSON PJ
Citation: Pj. Cumpson, ELASTIC-SCATTERING CORRECTIONS IN AES AND XPS .1. 2 RAPID MONTE-CARLOMETHODS FOR CALCULATING THE DEPTH DISTRIBUTION FUNCTION, Surface and interface analysis, 20(8), 1993, pp. 727-741
Risultati: 1-12 |