Authors: Cairney, JM Munroe, PR

Citation: Jm. Cairney et Pr. Munroe, Preparation of transmission electron microscope specimens from FeAl and WCpowders using focused-ion beam milling, MATER CHAR, 46(4), 2001, pp. 297-304

Authors: Cairney, JM Munroe, PR Sordelet, DJ

Citation: Jm. Cairney et al., Microstructural analysis of a FeAl/quasicrystal-based composite prepared using a focused ion beam miller, J MICROSC O, 201, 2001, pp. 201-211

Authors: Cairney, JM Smith, RD Munroe, PR

Citation: Jm. Cairney et al., Transmission electron microscope specimen preparation of metal matrix composites using the focused ion beam miller, MICROS MICR, 6(5), 2000, pp. 452-462

Authors: Cairney, JM Munroe, PR Schneibel, JH

Citation: Jm. Cairney et al., Examination of fracture surfaces using focused ion beam milling, SCR MATER, 42(5), 2000, pp. 473-478

Authors: Cairney, JM Munroe, PR

Citation: Jm. Cairney et Pr. Munroe, The effect of chromium on the B-2-DO3 transformation in Fe3Al, J MAT SCI L, 18(6), 1999, pp. 449-452