Authors: Campos, CS Coleoni, EA Trincavelli, JC Kaschny, J Hubbler, R Soares, MRF Vasconcellos, MAZ

Citation: Cs. Campos et al., Metallic thin film thickness determination using electron probe microanalysis, X-RAY SPECT, 30(4), 2001, pp. 253-259

Authors: Viseu, MI Edwards, K Campos, CS Costa, SMB

Citation: Mi. Viseu et al., Spontaneous vesicles formed in aqueous mixtures of two cationic amphiphiles, LANGMUIR, 16(5), 2000, pp. 2105-2114

Authors: Viseu, MI Velazquez, MM Campos, CS Garcia-Mateos, I Costa, SMB

Citation: Mi. Viseu et al., Structural transitions in a bicationic amphiphile system studied by light-scattering, conductivity, and surface tension measurements, LANGMUIR, 16(11), 2000, pp. 4882-4889