Authors:
Steinhauer, DE
Vlahacos, CP
Wellstood, FC
Anlage, SM
Canedy, C
Ramesh, R
Stanishevsky, A
Melngailis, J
Citation: De. Steinhauer et al., Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope, REV SCI INS, 71(7), 2000, pp. 2751-2758
Authors:
Steinhauer, DE
Vlahacos, CP
Wellstood, FC
Anlage, SM
Canedy, C
Ramesh, R
Stanishevsky, A
Melngailis, J
Citation: De. Steinhauer et al., Imaging of microwave permittivity, tunability, and damage recovery in (Ba,Sr)TiO3 thin films, APPL PHYS L, 75(20), 1999, pp. 3180-3182