Authors:
Muller, SG
Glass, RC
Hobgood, HM
Tsvetkov, VF
Brady, M
Henshall, D
Malta, D
Singh, R
Palmour, J
Carter, CH
Citation: Sg. Muller et al., Progress in the industrial production of SiC substrates for semiconductor devices, MAT SCI E B, 80(1-3), 2001, pp. 327-331
Authors:
Huang, XR
Dudley, M
Vetter, WM
Huang, W
Si, W
Carter, CH
Citation: Xr. Huang et al., Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image, J APPL CRYS, 32, 1999, pp. 516-524