Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-1
|
Results: 1
Characterization of thin-film amorphous semiconductors using spectroscopicellipsometry
Authors:
Jellison, GE Merkulov, VI Puretzky, AA Geohegan, DB Eres, G Lowndes, DH Caughman, JB
Citation:
Ge. Jellison et al., Characterization of thin-film amorphous semiconductors using spectroscopicellipsometry, THIN SOL FI, 377, 2000, pp. 68-73
Risultati:
1-1
|