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Results: 1-2 |
Results: 2
Structural studies and influence of the structure on the electrical and optical properties of microcrystalline silicon thin films produced by RF sputtering
Authors: Cerqueira, MF Ferreira, JA Adriaenssens, GJ
Citation: Mf. Cerqueira et al., Structural studies and influence of the structure on the electrical and optical properties of microcrystalline silicon thin films produced by RF sputtering, THIN SOL FI, 370(1-2), 2000, pp. 128-136
Temperature dependence of the first order Raman scattering in thin films of mu c-Si : H
Authors: Cerqueira, MF Ferreira, JA
Citation: Mf. Cerqueira et Ja. Ferreira, Temperature dependence of the first order Raman scattering in thin films of mu c-Si : H, J MATER PR, 93, 1999, pp. 235-238
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