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Results:
1-3
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Results: 3
Authors:
Hsiao, MS
Chakradhar, S
Citation: Ms. Hsiao et S. Chakradhar, Test set compaction using relaxed subsequence removal, J ELEC TEST, 16(4), 2000, pp. 319-327
Authors:
Hsiao, MS
Chakradhar, S
Citation: Ms. Hsiao et S. Chakradhar, Test set and fault partitioning techniques for static test sequence compaction for sequential circuits, J ELEC TEST, 16(4), 2000, pp. 329-338
Authors:
Balasubramanian, S
Pugalenthi, V
Anuradha, K
Chakradhar, S
Citation: S. Balasubramanian et al., Characterization of tannery effluents and the correlation between TDS, BODand COD, J ENVIR S A, 34(2), 1999, pp. 461-478
Risultati:
1-3
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