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Results: 1-6 |
Results: 6

Authors: Chamard, V Pichat, C Dolino, G
Citation: V. Chamard et al., Formation of porous silicon: an in situ investigation with high-resolutionX-ray diffraction, EUR PHY J B, 21(2), 2001, pp. 185-190

Authors: Chamard, V Pichat, C Dolino, G
Citation: V. Chamard et al., Rinsing and drying studies of porous silicon by high resolution X-ray diffraction, SOL ST COMM, 118(3), 2001, pp. 135-139

Authors: Chamard, V Dolino, G
Citation: V. Chamard et G. Dolino, X-ray diffraction investigation of n-type porous silicon, J APPL PHYS, 89(1), 2001, pp. 174-180

Authors: Chamard, V Metzger, TH Bellet-Amalric, E Daudin, B Adelmann, C Mariette, H Mula, G
Citation: V. Chamard et al., Structure and ordering of GaN quantum dot multilayers, APPL PHYS L, 79(13), 2001, pp. 1971-1973

Authors: Chamard, V Dolino, G Stettner, J
Citation: V. Chamard et al., X-ray scattering study of porous silicon layers, PHYSICA B, 283(1-3), 2000, pp. 135-138

Authors: Chamard, V Dolino, G Muller, F
Citation: V. Chamard et al., Origin of a parasitic surface film on p(+) type porous silicon, J APPL PHYS, 84(12), 1998, pp. 6659-6666
Risultati: 1-6 |