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Citation: A. Hefner et al., A high-speed thermal imaging system for semiconductor device analysis, P IEEE SEM, 2001, pp. 43-49

Authors: Hefner, AR Singh, R Lai, JS Berning, DW Bouche, S Chapuy, C

Citation: Ar. Hefner et al., SiC power diodes provide breakthrough performance for a wide range of applications, IEEE POW E, 16(2), 2001, pp. 273-280