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Citation: Dm. Solina et al., Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy, THIN SOL FI, 372(1-2), 2000, pp. 94-103

Authors: Cheary, RW Ying, MS

Citation: Rw. Cheary et Ms. Ying, Quantitative phase analysis by X-ray diffraction of martensite and austenite in strongly oriented orthodontic stainless steel wires, J MATER SCI, 35(5), 2000, pp. 1105-1113

Authors: Cheary, RW Dooryhee, E Lynch, P Armstrong, N Dligatch, S

Citation: Rw. Cheary et al., X-ray diffraction line broadening from thermally deposited gold films, J APPL CRYS, 33, 2000, pp. 1271-1283

Authors: Cheary, RW Coelho, AA

Citation: Rw. Cheary et Aa. Coelho, Axial divergence in a conventional X-ray powder diffractometer. I. Theoretical foundations, J APPL CRYS, 31, 1998, pp. 851-861

Authors: Cheary, RW Coelho, AA

Citation: Rw. Cheary et Aa. Coelho, Axial divergence in a conventional X-ray powder diffractometer. II. Realization and evaluation in a fundamental-parameter profile fitting procedure, J APPL CRYS, 31, 1998, pp. 862-868