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Results: 1-7 |
Results: 7

Authors: Bertagna, V Erre, R Rouelle, F Levy, D Petitdidier, S Chemla, M
Citation: V. Bertagna et al., Electrochemical impedance spectroscopy as a probe for wet chemical siliconoxide characterization, J SOL ST EL, 5(5), 2001, pp. 306-312

Authors: Siebert, E Boureau, G Mokchah, M Millot, F Chemla, M
Citation: E. Siebert et al., Analysis of transport phenomena in yttrium-doped zirconia in an oxygen chemical potential gradient and in short-circuit condition - Reply to the discussion from G. Petot-Ervas and C. Petot, SOL ST ION, 143(2), 2001, pp. 259-262

Authors: Bertagna, V Erre, R Rouelle, F Chemla, M Petitdidier, S Levy, D
Citation: V. Bertagna et al., Electrochemical study for the characterisation of wet silicon oxide surfaces, ELECTR ACT, 47(1-2), 2001, pp. 129-136

Authors: Bertagna, V Rouelle, F Erre, R Chemla, M
Citation: V. Bertagna et al., Electrochemical test for silicon surface contamination by copper traces inHF, HF plus HCl and HF+NH4F dilute solutions, SEMIC SCI T, 15(2), 2000, pp. 121-125

Authors: Bertagna, V Erre, R Rouelle, F Chemla, M
Citation: V. Bertagna et al., Ionic components dependence of the charge transfer reactions at the silicon/HF solution interface, J SOL ST EL, 4(1), 1999, pp. 42-51

Authors: Mokchah, M Siebert, E Millot, F Chemla, M Boureau, G
Citation: M. Mokchah et al., Comment about experimental procedure for the determination of diffusion coefficients in ionic compounds - application to yttrium-doped zirconia, SOL ST ION, 126(3-4), 1999, pp. 379-382

Authors: Bertagna, V Erre, R Rouelle, F Chemla, M
Citation: V. Bertagna et al., Corrosion rate of n- and p-silicon substrates in HF, HF+HCl, and HF+NH4F aqueous solutions, J ELCHEM SO, 146(1), 1999, pp. 83-90
Risultati: 1-7 |