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Results: 1-13 |
Results: 13
Grain boundary crack growth in interconnects with an electric current
Authors: Liu, CY Lee, S Chuang, TJ
Citation: Cy. Liu et al., Grain boundary crack growth in interconnects with an electric current, MAT SCI E B, 86(2), 2001, pp. 101-108
Surface chemistry: from vibrational spectroscopy to photoemission spectromicroscopy
Authors: Chuang, TJ Chan, YL Chuang, P Klauser, R Ko, CH Wei, DH
Citation: Tj. Chuang et al., Surface chemistry: from vibrational spectroscopy to photoemission spectromicroscopy, APPL SURF S, 169, 2001, pp. 1-10
Adsorption of azomethane on Cu(110) and Cu(111) surfaces
Authors: Chuang, P Chan, YL Chuang, CH Chien, SH Chuang, TJ
Citation: P. Chuang et al., Adsorption of azomethane on Cu(110) and Cu(111) surfaces, APPL SURF S, 169, 2001, pp. 153-159
Performance of the SRRC scanning photoelectron microscope
Authors: Hong, IH Lee, TH Yin, GC Wei, DH Juang, JM Dann, TE Klauser, R Chuang, TJ Chen, CT Tsang, KL
Citation: Ih. Hong et al., Performance of the SRRC scanning photoelectron microscope, NUCL INST A, 467, 2001, pp. 905-908
Constrained sintering of glass, glass-ceramic and ceramic coatings on metal substrates
Authors: Calata, JN Lu, GQ Chuang, TJ
Citation: Jn. Calata et al., Constrained sintering of glass, glass-ceramic and ceramic coatings on metal substrates, SURF INT AN, 31(7), 2001, pp. 673-681
Oxidation states in scanning-probe-induced Si3N4 to SiOx conversion studied by scanning photoemission microscopy
Authors: Klauser, R Hong, IH Su, HJ Chen, TT Gwo, S Wang, SC Chuang, TJ Gritsenko, VA
Citation: R. Klauser et al., Oxidation states in scanning-probe-induced Si3N4 to SiOx conversion studied by scanning photoemission microscopy, APPL PHYS L, 79(19), 2001, pp. 3143-3145
Adsorption of fluorine on bare, hydrogen- and hydrocarbon-covered diamond C(111) surfaces
Authors: Yamada, T Seki, H Chuang, TJ
Citation: T. Yamada et al., Adsorption of fluorine on bare, hydrogen- and hydrocarbon-covered diamond C(111) surfaces, JPN J A P 1, 39(4A), 2000, pp. 1826-1834
Fatigue model for fiber-reinforced polymeric composites
Authors: Tang, HC Nguyen, T Chuang, TJ Chin, J Lesko, J Wu, HF
Citation: Hc. Tang et al., Fatigue model for fiber-reinforced polymeric composites, J MAT CIV E, 12(2), 2000, pp. 97-104
All-optical switching with pulsed signals in an all-semiconductor-optical-amplifier loop device
Authors: Lee, JH Yang, CC Shih, MC Chuang, TJ
Citation: Jh. Lee et al., All-optical switching with pulsed signals in an all-semiconductor-optical-amplifier loop device, OPT COMMUN, 185(4-6), 2000, pp. 393-397
Nonlinear switching in an all-semiconductor-optical-amplifier loop device
Authors: Lee, JH Wang, DA Chiang, HJ Huang, DW Gurtler, S Yang, CC Kiang, YW Chen, BC Shih, MC Chuang, TJ
Citation: Jh. Lee et al., Nonlinear switching in an all-semiconductor-optical-amplifier loop device, IEEE PHOTON, 11(2), 1999, pp. 236-238
The surface chemistry of methyl and methylene radicals adsorbed on Cu(111)
Authors: Chuang, TJ Chan, YL Chuang, P Klauser, R
Citation: Tj. Chuang et al., The surface chemistry of methyl and methylene radicals adsorbed on Cu(111), J ELEC SPEC, 99, 1999, pp. 149-173
Micro-mechanic model for cathodic blister growth in painted steel
Authors: Chuang, TJ Nguyen, T Lee, S
Citation: Tj. Chuang et al., Micro-mechanic model for cathodic blister growth in painted steel, J COAT TECH, 71(895), 1999, pp. 75-85
Analysis of the single-fiber fragmentation test
Authors: Lee, S Nguyen, T Chin, J Chuang, TJ
Citation: S. Lee et al., Analysis of the single-fiber fragmentation test, J MATER SCI, 33(21), 1998, pp. 5221-5228
Risultati: 1-13 |