Authors: Kuball, M Demangeot, F Frandon, J Renucci, MA Sands, H Batchelder, DN Clur, S Briot, O

Citation: M. Kuball et al., Degradation of AlGaN during high-temperature annealing monitored by ultraviolet Raman scattering, APPL PHYS L, 74(4), 1999, pp. 549-551