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Results: 1-7 |
Results: 7

Authors: Cong, D Fong, AKY Lee, R Pang, KS
Citation: D. Cong et al., Absorption of benzoic acid in segmental regions of the vascularly perfusedrat small intestine preparation, DRUG META D, 29(12), 2001, pp. 1539-1547

Authors: Kroger, R Eizenberg, M Cong, D Yoshida, N Chen, LY Ramaswami, S Carl, D
Citation: R. Kroger et al., Influence of diffusion barriers on the nucleation and growth of CVD Cu forinterconnect applications, MICROEL ENG, 50(1-4), 2000, pp. 375-381

Authors: Voss, S Gandikota, S Chen, LY Tao, R Cong, D Duboust, A Yoshida, N Ramaswami, S
Citation: S. Voss et al., Chemical studies of CVD Cu deposited on Ta and TaN barriers under various process conditions, MICROEL ENG, 50(1-4), 2000, pp. 501-508

Authors: Gandikota, S Voss, S Tao, R Duboust, A Cong, D Chen, LY Ramaswami, S Carl, D
Citation: S. Gandikota et al., Adhesion studies of CVD copper metallization, MICROEL ENG, 50(1-4), 2000, pp. 547-553

Authors: Cong, D Doherty, M Pang, KS
Citation: D. Cong et al., A new physiologically based, segregated-flow model to explain route-dependent intestinal metabolism, DRUG META D, 28(2), 2000, pp. 224-235

Authors: Kroger, R Eizenberg, M Rabkin, E Cong, D Chen, L
Citation: R. Kroger et al., The role of kinetics in the nucleation and void formation in copper films produced by chemical vapor deposition, J APPL PHYS, 88(4), 2000, pp. 1867-1872

Authors: Kroger, R Eizenberg, M Cong, D Yoshida, N Chen, LY Ramaswami, S Carl, D
Citation: R. Kroger et al., Properties of copper films prepared by chemical vapor deposition for advanced metallization of microelectronic devices, J ELCHEM SO, 146(9), 1999, pp. 3248-3254
Risultati: 1-7 |