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Results: 1-10 |
Results: 10

Authors: Petelski, T Conroy, RS Bencheikh, K Mlynek, J Schiller, S
Citation: T. Petelski et al., All-solid-state, tunable, single-frequency source of yellow light for high-resolution spectroscopy, OPTICS LETT, 26(13), 2001, pp. 1013-1015

Authors: Moothoo, DN Arlt, J Conroy, RS Akerboom, F Voit, A Dholakia, K
Citation: Dn. Moothoo et al., Beth's experiment using optical tweezers, AM J PHYS, 69(3), 2001, pp. 271-276

Authors: Clifford, MA Lancaster, GPT Conroy, RS Dholakia, K
Citation: Ma. Clifford et al., Stabilization of an 852 nm extended cavity diode laser using the Zeeman effect, J MOD OPT, 47(11), 2000, pp. 1933-1940

Authors: Conroy, RS Hewett, JJ Lancaster, GPT Sibbett, W Allen, JW Dholakia, K
Citation: Rs. Conroy et al., Characterisation of an extended cavity violet diode laser, OPT COMMUN, 175(1-3), 2000, pp. 185-188

Authors: Kemp, AJ Friel, GJ Lake, TK Conroy, RS Sinclair, BD
Citation: Aj. Kemp et al., Polarization effects, birefringent filtering, and single-frequency operation in lasers containing a birefringent gain crystal, IEEE J Q EL, 36(2), 2000, pp. 228-235

Authors: Conroy, RS Carleton, A Carruthers, A Sinclair, BD Rae, CF Dholakia, K
Citation: Rs. Conroy et al., A visible extended cavity diode laser for the undergraduate laboratory, AM J PHYS, 68(10), 2000, pp. 925-931

Authors: Conroy, RS Carleton, A Dholakia, K
Citation: Rs. Conroy et al., A compact high-performance extended-cavity diode laser at 635 nm, J MOD OPT, 46(12), 1999, pp. 1787-1791

Authors: Conroy, RS Rae, CF Dunn, MH Sinclair, BD Ley, JM
Citation: Rs. Conroy et al., Compact, actively Q-switched optical parametric oscillator, OPTICS LETT, 24(22), 1999, pp. 1614-1616

Authors: Lancaster, GPT Conroy, RS Clifford, MA Arlt, J Dholakia, K
Citation: Gpt. Lancaster et al., A polarisation spectrometer locked diode laser for trapping cold atoms, OPT COMMUN, 170(1-3), 1999, pp. 79-84

Authors: Kemp, AJ Conroy, RS Friel, GJ Sinclair, BD
Citation: Aj. Kemp et al., Guiding effects in Nd : YVO4 microchip lasers operating well above threshold, IEEE J Q EL, 35(4), 1999, pp. 675-681
Risultati: 1-10 |